Three-dimensional mapping of tellurium inclusions in CdZnTe crystals by means of improved optical microscopy

Journal of Crystal Growth

Volumn 318, Issue 1, 2011, Pages 1167-1170

  Zambelli, N ^a   Marchini, L ^a   Zha, M ^a   Zappettini, A ^a  

^a IMEM CNR   (Italy)

Author keywords

B1. CdTe; B2. CdZnTe

Indexed keywords

B2. CDZNTE; BRIDGMAN; CDTE; CDZNTE CRYSTALS; CHARACTERIZATION METHODS; CRYSTAL QUALITIES; FORMATION MECHANISM; INCLUSION DISTRIBUTION; KEYPOINTS; MATRIX; STANDARD TRANSMISSION; THREE DIMENSIONAL MAPPING; THREE DIMENSIONS; X-RAY IMAGING DEVICES;

CADMIUM COMPOUNDS; CRYSTALS; INCLUSIONS; LIGHT TRANSMISSION; OPTICAL MICROSCOPY; TELLURIUM;

CADMIUM ALLOYS;

EID: 79952739045     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.10.203     Document Type: Conference Paper

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