Accurate measurement of electrical bulk resistivity and surface leakage of CdZnTe radiation detector crystals

Journal of Applied Physics

Volumn 100, Issue 1, 2006, Pages

  Prokesch, Michael ^a   Szeles, Csaba ^a  

^a II VI Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK RESISTIVITY; SURFACE LEAKAGE CURRENTS; SURFACE PASSIVATION;

CURRENT VOLTAGE CHARACTERISTICS; DATA REDUCTION; ELECTRODEPOSITION; LEAKAGE CURRENTS; RADIATION DETECTORS; SEMICONDUCTING CADMIUM COMPOUNDS;

ELECTRIC CONDUCTIVITY;

EID: 33746215293     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2209192     Document Type: Article

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