Contact-independent measurement of electrical conductance of a thin film with a nanoscale sensor

Nano Letters

Volumn 11, Issue 10, 2011, Pages 4102-4106

  Mentzel, Tamar S ^a   MacLean, Kenneth ^a   Kastner, Marc A ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

amorphous germanium; contact effects; Contact independent conductance measurement; MOSFET; nanoscale sensor

Indexed keywords

AMORPHOUS GERMANIUM; CONTACT EFFECTS; CONTACT-INDEPENDENT CONDUCTANCE MEASUREMENT; MOS-FET; NANOSCALE SENSORS;

AMORPHOUS FILMS; CHARACTERIZATION; CONTACTS (FLUID MECHANICS); ELECTRIC CONDUCTANCE; GERMANIUM; GRAPHENE; MOSFET DEVICES; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SENSORS; THIN FILMS;

ELECTRIC VARIABLES MEASUREMENT;

EID: 80054034309     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl201650u     Document Type: Article

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