Morphology of the metal-organic semiconductor contacts: The role of substrate surface treatment

Springer Proceedings in Physics

Volumn 129, Issue , 2009, Pages 205-210

  Petrović, Andraž ^a   Pavlica, Egon ^a   Bratina, Gvido ^a  

^a UNIVERSITY OF NOVA GORICA   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; EXCITONS; GROWTH RATE; METALS; ORGANOMETALLICS; SELF ASSEMBLED MONOLAYERS; SEMICONDUCTING ORGANIC COMPOUNDS; SILICA; SURFACE TREATMENT; WETTING;

AREAL DENSITIES; METALLIC CONTACTS; MORPHOLOGICAL FEATURES; PENTACENE INTERFACE; PENTACENE LAYERS; SEMICONDUCTOR CONTACTS; STRUCTURAL DEFECT; SUBSTRATE SURFACE;

SUBSTRATES;

EID: 85028685094     PISSN: 09308989     EISSN: 18674941     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-95930-4_34     Document Type: Chapter

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