The effect of electrostatic screening on a nanometer scale electrometer

Nano Letters

Volumn 11, Issue 1, 2011, Pages 30-34

  MacLean, Kenneth ^a   Mentzel, Tamar S ^a   Kastner, Marc A ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Charge transport; Electrostatic screening; Nanoscale electrometer; Thin film

Indexed keywords

CHARGE TRANSPORT; ELECTROSTATIC ENVIRONMENTS; ELECTROSTATIC SCREENING; MOS-FET; NANO SCALE; NANO-METER SCALE; NANOSCALE ELECTROMETER; P-TYPE SUBSTRATES; ROOM TEMPERATURE; SCREENING EFFECT; SILICON MOSFET;

ELECTROSTATICS; MOSFET DEVICES; NANOSTRUCTURED MATERIALS; SEMICONDUCTING SILICON COMPOUNDS; THIN FILMS;

ELECTROMETERS;

EID: 79951543891     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl102121e     Document Type: Article

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