Measuring thermoelectric property of nano-heterostructure

Chinese Physics B

Volumn 20, Issue 10, 2011, Pages

  Lu, Hong Liang ^a   Zhang, Chen Dong ^a   Cai, Jin Ming ^a   Gao, Min ^a   Zou, Qiang ^a   Guo, Hai Ming ^a   Gao, Hong Jun ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

four probe scanning tunneling microscope; grapheme; nanoheterostructure; thermoelectric property

Indexed keywords

EPITAXIALLY GROWN; FOUR-PROBE; GRAPHEME; IN-SITU FABRICATION; NANO-HETEROSTRUCTURES; NANOHETEROSTRUCTURE; PRECISE CONTROL; ROOM TEMPERATURE; RU(0001); SCANNING TUNNELING MICROSCOPES; THERMOELECTRIC POTENTIAL; THERMOELECTRIC PROPERTIES; THERMOELECTRIC PROPERTY; TIP-SAMPLE CONTACT;

GRAPHENE; PROBES; SCANNING TUNNELING MICROSCOPY; THERMOELECTRIC EQUIPMENT; TUNGSTEN;

HETEROJUNCTIONS;

EID: 80053933030     PISSN: 16741056     EISSN: None     Source Type: Journal    
DOI: 10.1088/1674-1056/20/10/107301     Document Type: Article

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