Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis

Machine Vision and Applications

Volumn 22, Issue 4, 2011, Pages 629-649

  Tsai, Du Ming ^a   Tsai, Hsin Yang ^a  

^a YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Defect detection; Liquid crystal display; Motion images; Mura; Optical flow; Surface inspection

Indexed keywords

AUTOMATIC VISUAL INSPECTION; DEFECT DETECTION; DISCRIMINATIVE FEATURES; FIXED CAMERAS; FLOW DENSITY; FRAMES PER SECONDS; HIGH PROCESSING RATES; IMAGE SEQUENCE; LCD PANELS; MEAN FLOW; MOTION ANALYSIS; MOTION IMAGES; MURA; MURA DEFECT; MURA DETECTION; ON FLOW; ONE-DIMENSIONAL OPTICAL FLOWS; OPTICAL FLOW METHODS; OPTICAL FLOW TECHNIQUES; SMALL SIZE; STATIONARY SYSTEMS; STILL IMAGES; SURFACE INSPECTION; SYNTHETIC SURFACES;

COMPUTER VISION; INSPECTION; LIGHT REFLECTION; LIQUID CRYSTAL DISPLAYS; SURFACE DEFECTS;

OPTICAL FLOWS;

EID: 80053893944     PISSN: 09328092     EISSN: 14321769     Source Type: Journal    
DOI: 10.1007/s00138-010-0256-1     Document Type: Article

References (17)

1. Taniguchi, K., Ueta, K., Tatsumi, S.:Amura detectionmethod. Pattern Recognit. 39, 1044-1052 (2006).
2. Tamura, T., Satoh, T., Uchida, T., Furuhata, T.: Quantitative evaluation of luminance nonuniformity "mura" in LCDs based on just noticeable difference (JND) contrast at various background luminances. IEICE Trans. Electron. E89-C, 1435-1440 (2006).
3. Lee, J.Y., Yoo, S.I.: Automatic detection of region-mura defects in TFT-LCD. IEICE Trans. Inf. Syst. E87, 2371-2378 (2004).
4. Taniguchi, K., Ueta, K., Tatsumi, S.:Adetectionmethod of mura on a coated layer using interference light. In: IEEE International Conference on Systems, Man and Cybernetics, pp. 5047-5052 (2006).
5. Saitoh, F.: Boundary extraction of brightness unevenness on LCD display using genetic algorithm based on perceptive grouping factors. In: Proceedings of the International Conference on Image Processing, Kobe, Japan, pp. 308-312 (1999).
6. Kim, W.-S., Kwak, D.-M., Song, Y.-C., Choi, D.-H., Park, K.-H.: Detection of spot-type defects on liquid crystal display modules. Key Eng. Mater. 270-273, 808-813 (2004).
7. Tsai, D.-M., Lin, P.-C., Lu, C.-J.: An independent component analysis- based filter design for defect detection in low-contrast surface images. Pattern Recognit. 39, 1679-1694 (2006).
8. Wang, Z., Ma, L.: Implementation of region-mura detection based on recursive polynomial-surface fitting algorithm. Second Asia International Symposium on Mechatronics (AISM), Hong Kong (2006).
9. Ryu, J.-S., Oh, J.-H., Kim, J.-G., Koo, T.-M., Park, K.-H.: TFTLCD panel blob-mura inspection using the correlation of wavelet coefficients. TENCON 2004 (2004 IEEE Region 10 Conference), Chiang Mai, Thailand, pp. 219-222 (2004).
10. Oh, J.-H., Kwak, D.-M., Lee, K.-B., Song, Y.-C., Choi, D.-H., Park, K.-H.: Line defect detection in TFT-LCD using directional filter bank and adaptive multilevel thresholding. Key Eng. Mater. 270- 273, 233-238 (2004).
11. Zhang, Y., Zhang, J.: Fuzzy recognition of the defect of TFTLCD. Proc. SPIE 5637, 233-240 (2005).
12. Chen, H.-C., Fang, L.-T., Lee, L.: LOG filter based inspection of cluster mura and vertical-band mura on liquid crystal displays. Proc. SPIE-IS&T Electronic Image 5679, 257-265 (2005).
13. Song, Y.-C., Choi, D.-H., Park, K.-H.: Multiscale detection of defect in thin film transistor liquid crystal display panel. Japanese J. Appl. Phys. 43, 5465-5468 (2004).
14. Barron, J.L., Fleet, D.J., Beauchemin, S.S.: Performance of optical flow techniques. Int. J. Comput. Vis. 12, 43-77 (1994).
15. Lucas, B.D., Kanade, T.: An iterative image registration technique with an application to stereo vision. In: Proceedings of Imaging Understanding Workshop, pp. 121-130 (1981).
16. SEMI D31-1102: Definition of measurement index (SEMU) for luminance mura in FPD image quality inspection. SEMI Technical Report (2002).
17. Gibour, V., Boher, P., Leroux, T., Guo, J.-J., Huang, B.-H., Wang, K., Chen, C.-H.: Robustness of automated mura inspection versus measurement conditions. International Display Manufacturing Conference (IDMC), pp. 403-406 (2005).