Robustness of automated Mura inspection versus measurement conditions

International Display Manufacturing Conference and Exhibition, IDMC'05

Volumn , Issue , 2005, Pages 403-406

  Gibour, Véronique ^a   Boher, Pierre ^a   Leroux, Thierry ^a   Guo, Jia Jia ^b   Huang, Bor Hann ^b   Wang, Kerson ^b   Chen, Chun Hsia ^b  

^a ELDIM   (France)

^b AU OPTRONICS CORPORATION   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENT THEORY; PERFORMANCE; QUALITY CONTROL; ROBUSTNESS (CONTROL SYSTEMS); SENSITIVITY ANALYSIS; SIGNAL THEORY;

2D LUMINANCE METERS; AUTOMATED MURA INSPECTION; MURA GENERATOR SYSTEMS; TILT ANGLE;

LIQUID CRYSTAL DISPLAYS;

EID: 33644648698     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. V. Gibour, T. Leroux, SID03, P53-3, 2003
2. V. Gibour, P. Boher, Display devices, summer 04, 34, 2004
3. SEMI D31-1102, Definition of measurement index (SEMU) for luminance MURA in FPD image quality inspection
4. J.J. Guo, B.H. Huang, K. Wang, C., Chen, Development of Mura generator system, Taiwan Display conference, 2004.