Multiscale detection of defect in thin film transistor liquid crystal display panel

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 8 A, 2004, Pages 5465-5468

  Song, Young Chul ^a   Choi, Doo Hyun ^a   Park, Kil Houm ^a  

^a Kyungpook National University   (South Korea)

Author keywords

Adaptive multilevel threshold; Blob Mura defect detection; Multiscale; TFT LCD panel

Indexed keywords

ALGORITHMS; CAMERAS; COMPUTER SIMULATION; DEFECTS; LIQUID CRYSTAL DISPLAYS; OPTIMIZATION;

BLOB-MURA DEFECT DETECTION; LINE-SCAN CAMERAS; MULTILEVEL-THRESHOLD; MULTISCALE;

THIN FILM TRANSISTORS;

EID: 6344253017     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.5465     Document Type: Article

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