An independent component analysis-based filter design for defect detection in low-contrast surface images

Pattern Recognition

Volumn 39, Issue 9, 2006, Pages 1679-1694

  Tsai, Du Ming ^a   Lin, Ping Chieh ^a   Lu, Chi Jie ^a  

^a YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Convolution filter; Defect detection; Independent component analysis; Particle swarm optimization; Surface inspection

Indexed keywords

COMPUTATION THEORY; CONVOLUTION; DEFECTS; DIGITAL FILTERS; IMAGE ANALYSIS; LIQUID CRYSTAL DISPLAYS; OPTIMIZATION;

CONVOLUTION FILTER; DEFECT DETECTION; PARTICLE SWARM OPTIMIZATION; SURFACE INSPECTION;

INDEPENDENT COMPONENT ANALYSIS;

EID: 33745047543     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2006.03.005     Document Type: Article

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