Fuzzy recognition of the defect of TFT-LCD

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5637, Issue , 2005, Pages 233-240

  Zhang, Yu ^a   Zhang, Jian ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Defect inspection; Fuzzy expert system; TFT LCD

Indexed keywords

COMPUTATIONAL COMPLEXITY; EXPERT SYSTEMS; FUZZY SETS; MATHEMATICAL MODELS; PERSONAL COMPUTERS; POINT DEFECTS; REAL TIME SYSTEMS; THIN FILM TRANSISTORS;

DEFECT DETECTION; DEFECT INSPECTION; FUZZY EXPERT SYSTEMS; ON-LINE REAL-TIME DETECTION METHOD;

LIQUID CRYSTAL DISPLAYS;

EID: 19844374398     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.572556     Document Type: Conference Paper

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