Detection of spot-type defects on liquid crystal display modules

Key Engineering Materials

Volumn 270-273, Issue I, 2004, Pages 808-813

  Kim, Woo Seob ^a   Kwak, Dong Min ^b   Song, Young Chul ^a   Choi, Doo Hyun ^a   Park, Kil Houm ^a  

^a Kyungpook National University   (South Korea)

^b Agency for Defence Development   (South Korea)

Author keywords

Adaptive multilevel thresholding; Inspection; LCM; Spot type defects

Indexed keywords

ALGORITHMS; CAMERAS; COMPUTER VISION; CRYSTAL DEFECTS; IMAGE ANALYSIS; INSPECTION; STATISTICAL METHODS;

ADAPTIVE MULTILEVEL THREHOLDING; LIQUID CRYSTAL DISPLAY MODULES (LCM); PATTERN ELIMINATION; SPOT-TYPE DEFECTS;

LIQUID CRYSTAL DISPLAYS;

EID: 8644232477     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (5)

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