LOG filter based inspection of Cluster Mura and Vertical-Band Mura on Liquid Crystal Displays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5679, Issue , 2005, Pages 257-265

  Chen, Fisin Chia ^a   Fang, Li Te ^a   Lee, Louis ^b   Wen, Chao Hua ^b   Cheng, Shang Yuan ^c   Wang, Sheng Jyh ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b Taiwan TFT LCD Association   (Taiwan)

^c INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

Laplacian of Gaussian; Mura defects; Mura detection; SEMU

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; DEFECTS; LIQUID CRYSTAL DISPLAYS; OPTICAL FILTERS; THIN FILM TRANSISTORS;

LAPLACIAN OF GAUSSIAN (LOG) FILTERS; MURA DEFECTS; MURA DETECTION; VISUAL QUALITY;

IMAGE QUALITY;

EID: 21844475089     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.586688     Document Type: Conference Paper

References (10)

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