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Volumn , Issue , 2011, Pages 17-22

Design and technology of high-power silicon devices

Author keywords

diode; Power semiconductor devices; silicon; thyristor; transistor

Indexed keywords

BLOCKING VOLTAGE; CURRENT TRENDS; DESIGN AND TECHNOLOGY; HIGH-POWER; HIGH-POWER DEVICES; IC INDUSTRY; INTEGRATED GATE-COMMUTATED THYRISTORS; LARGE AREA DEVICES; LINE VOLTAGE; LOW-POWER DEVICES; OUTPUT CURRENT; PIN DIODE; POWER ELECTRONICS SYSTEMS; POWER SEMICONDUCTOR DEVICES; POWER SEMICONDUCTORS; SI TECHNOLOGY; SILICON DEVICES; SILICON-BASED DEVICES; TECHNICAL SOLUTIONS; VOLTAGE RATINGS;

EID: 80053338822     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (26)
  • 3
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    • Ultra High Voltage Semiconductor Power Devices for Grid Applications
    • M. Rahimo, "Ultra High Voltage Semiconductor Power Devices for Grid Applications", Proc. IEDM2010, San Franscisco, pp.13.4.1-4.
    • Proc. IEDM2010, San Franscisco
    • Rahimo, M.1
  • 7
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  • 8
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  • 9
    • 80053317371 scopus 로고    scopus 로고
    • Wide Band-Gap Power Semiconductor Devices
    • J. Milan, "Wide Band-Gap Power Semiconductor Devices", Proc. ISPS'06, Prague, pp. 2-6.
    • Proc. ISPS'06, Prague , pp. 2-6
    • Milan, J.1
  • 11
    • 80053311811 scopus 로고    scopus 로고
    • HVDC〉HVDC References 〉Asia〉Xiangjiaba Shanghai
    • http://www.abb.com/hvdc HVDC〉HVDC References 〉Asia〉 Xiangjiaba Shanghai
  • 12
    • 80053320255 scopus 로고    scopus 로고
    • HVDC〉HVDC References 〉Asia〉 North East - Agra
    • http://www.abb.com/hvdc HVDC〉HVDC References 〉Asia〉 North East - Agra
  • 13
    • 0035390050 scopus 로고    scopus 로고
    • High-power semiconductor device: A symmetric gate commutated turn-off thyristor
    • DOI 10.1049/ip-epa:20010435
    • H. Iwamoto, K. Satoh, M. Yamamoto, A. Kawakami, "High-power semiconductor device: a symmetric gate commutated turn-off thyristor", IEE Proceedings Electr. Power Appl. Vol. 148, 2001, pp.363-368. (Pubitemid 32705134)
    • (2001) IEE Proceedings: Electric Power Applications , vol.148 , Issue.4 , pp. 363-368
    • Iwamoto, H.1    Satoh, K.2    Yamamoto, M.3    Kawakami, A.4
  • 17
    • 77949943222 scopus 로고    scopus 로고
    • The Radiation Enhanced Diffusion (RED) Diode Realization of a Large Area p+p-n-n+ Structure with High SOA
    • . J. Vobecky, V. Zahlava, K. Hemmann, M. Arnold, M. Rahimo "The Radiation Enhanced Diffusion (RED) Diode Realization of a Large Area p+p-n-n+ Structure with High SOA", Proc. ISPSD'2009, Barcelona, pp. 144-147.
    • Proc. ISPSD'2009, Barcelona , pp. 144-147
    • Vobecky, J.1    Zahlava, V.2    Hemmann, K.3    Arnold, M.4    Rahimo, M.5
  • 18
    • 0742267116 scopus 로고    scopus 로고
    • Axial lifetime control in silicon power diodes by irradiation with protons, alphas, low- And high-energy electrons
    • P. Hazdra, J. Vobecky, H. Dorschner, K. Brand, "Axial lifetime control in silicon power diodes by irradiation with protons, alphas, low- and high-energy electrons", Microelectronics Journal 35, 2004, pp. 249-257.
    • (2004) Microelectronics Journal , vol.35 , pp. 249-257
    • Hazdra, P.1    Vobecky, J.2    Dorschner, H.3    Brand, K.4
  • 19
    • 0003351715 scopus 로고    scopus 로고
    • Axial recombination centre technology for freewheeling diodes
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  • 23
    • 84864750375 scopus 로고    scopus 로고
    • Field Shielded Anode (FSA) Concept Enabling Higher Temperature Operation of Fast Recovery Diodes
    • accepted
    • S. Matthias, J. Vobecky, C. Corvasce, A. Kopta "Field Shielded Anode (FSA) Concept Enabling Higher Temperature Operation of Fast Recovery Diodes", Proc. ISPSD2011, San Diego, accepted.
    • Proc. ISPSD2011, San Diego
    • Matthias, S.1    Vobecky, J.2    Corvasce, C.3    Kopta, A.4
  • 24
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  • 26
    • 84876418478 scopus 로고    scopus 로고
    • Large Area Fast Recovery Diode with Very High SOA Capability for IGCT Applications
    • accepted for publication
    • J. Vobecky, R. Siegrist, M. Arnold, K. Tugan, "Large Area Fast Recovery Diode with Very High SOA Capability for IGCT Applications", Proc. PCIM 2011, Nuremberg, accepted for publication.
    • Proc. PCIM 2011, Nuremberg
    • Vobecky, J.1    Siegrist, R.2    Arnold, M.3    Tugan, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.