The Field Charge Extraction (FCE) diode a novel technology for soft recovery high voltage diodes

Proceedings of the International Symposium on Power Semiconductor Devices and ICs

Volumn , Issue , 2005, Pages 83-86

  Kopta, A ^a   Rahimo, M ^a  

^a ABB SWITZERLAND LTD   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC FIELDS; EXTRACTION; VOLTAGE CONTROL;

DIODE STRUCTURES; FIELD CHARGE EXTRACTION (FCE); VOLTAGE DIODES;

SEMICONDUCTOR DIODES;

EID: 27744556722     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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2. M.T. Rahimo, A. Kopta, S. Eicher, N. Kaminski, F. Bauer, U. Schlapbach, S. Linder, "Extending the Boundary Limits of High Voltage IGBTs and Diodes to above 8kV", Proc. ISPSD'02, pp. 41-44, Santa Fe, New Mexico, USA, June 2002.
3. M. Kitagawa, K. Matsushita, A. Nakagawa, "High Voltage (4kV) Emitter Short Type Diode (ESD)", Proc. ISPSD'92, pp. 60-65, Japan May, 1992.
4. K. Matsushita, T. Shinohe, M. Tsukuda, Y. Minami, J. Miwa, S. Yanagisawa, H. Ohashi, "4.5kV High Speed and Rugged Planar Diode with Novel Carrier Distribution Control", Proc. ISPSD'98, pp. 191-194, Kyoto, Japan, June 1998.
5. A. Porst, F. Auerbach, H. Brunner, G. Deboy, F. Hille, "Improvement of the Diode Characteristics Using Emitter- Controlled Principles (EMCON-Diode)", Proc ISPSD'97, pp. 213-216, Weimar, Germany, May 1997.
6. K. Satoh, T. Nakagawa, K. Morishita, S. Koga, A. Kawakami, "4.5kV Soft Recovery Diode With Carrier Stored Structure", Proc. ISPSD'98, pp. 313 316, Kyoto, Japan, June 1998.
7. J. Lutz, M. Domeij, "Dynamic Avalanche and Reliability of High Voltage Diodes", Microelectronic Reliability 43, p. 529, 2003.
8. M.T. Rahimo, A. Kopta, S. Eicher, U. Schlapbach, S. Linder, "Switching-Self-Clamping-Mode "SSCM", a breakthrough in SOA performance for high voltage IGBTs and Diodes" Proc. ISPSD'04, pp. 437 440, Kitakyushu, Japan, May 2004.