-
1
-
-
0003351715
-
Axial recombination centre technology for freewheeling diodes
-
Lutz L. Axial recombination centre technology for freewheeling diodes. Proc. EPE'97. 1997;1.502-1.506.
-
(1997)
Proc. EPE'97
, pp. 1502-1506
-
-
Lutz, L.1
-
2
-
-
0034449719
-
A new degree of freedom in diode optimization: Arbitrary axial lifetime profiles by means of ion irradiation
-
Hazdra P., Vobecký J., Galster N., Humbel O., Dalibor T. A new degree of freedom in diode optimization: arbitrary axial lifetime profiles by means of ion irradiation. Proc. ISPSD'2000. 2000;123-1266.
-
(2000)
Proc. ISPSD'2000
, pp. 123-1266
-
-
Hazdra, P.1
Vobecký, J.2
Galster, N.3
Humbel, O.4
Dalibor, T.5
-
3
-
-
0000065947
-
The MeV-implantation facility at Bochum
-
Brand K. The MeV-implantation facility at Bochum. Proc. IIT'94. 1994;458-461.
-
(1994)
Proc. IIT'94
, pp. 458-461
-
-
Brand, K.1
-
4
-
-
38249020477
-
The irradiation laboratory at ČKD semiconductors Praha
-
Kliský V. The irradiation laboratory at ČKD semiconductors Praha. Nucl. Instrum. Meth. B. 50:1990;420-422.
-
(1990)
Nucl. Instrum. Meth. B
, vol.50
, pp. 420-422
-
-
Kliský, V.1
-
5
-
-
0033904955
-
Radiation field distributions of an industrial electron beam accelerator
-
Dorschner H., Jenschke W., Lunkwitz K. Radiation field distributions of an industrial electron beam accelerator. Nucl. Instrum. Meth. B. 161-163:2000;1154-1158.
-
(2000)
Nucl. Instrum. Meth. B
, vol.161-163
, pp. 1154-1158
-
-
Dorschner, H.1
Jenschke, W.2
Lunkwitz, K.3
-
6
-
-
0036576988
-
Defect distribution in MeV proton irradiated silicon measured by high-voltage current transient spectroscopy
-
Hazdra P., Brand K., Vobecký J. Defect distribution in MeV proton irradiated silicon measured by high-voltage current transient spectroscopy. Nucl. Instrum. Meth. B. 192:2002;291-300.
-
(2002)
Nucl. Instrum. Meth. B
, vol.192
, pp. 291-300
-
-
Hazdra, P.1
Brand, K.2
Vobecký, J.3
-
7
-
-
0004022746
-
-
Silvaco Int., Santa Clara
-
ATLAS User's Manual, Silvaco Int., Santa Clara, 1998.
-
(1998)
ATLAS User's Manual
-
-
-
8
-
-
0032646632
-
Nondestructive defect characterization and engineering in contemporary silicon power devices
-
Hazdra P., Vobecký J. Nondestructive defect characterization and engineering in contemporary silicon power devices. Solid State Phenom. 69-70:1999;545-550.
-
(1999)
Solid State Phenom.
, vol.69-70
, pp. 545-550
-
-
Hazdra, P.1
Vobecký, J.2
-
10
-
-
78649887646
-
Effect of defects produced by MeV H and He ion implantation on characteristics of power silicon P-i-N diodes
-
Hazdra P., Brand K., Vobecký J. Effect of defects produced by MeV H and He ion implantation on characteristics of power silicon P-i-N diodes. Proc. IIT'2000. 2000;135-138.
-
(2000)
Proc. IIT'2000
, pp. 135-138
-
-
Hazdra, P.1
Brand, K.2
Vobecký, J.3
-
11
-
-
36549100008
-
Deep level transient spectroscopy of fast ion tracks in silicon
-
Hallén A., Sundquist B.U.R., Paska Z., Svensson B.G., Rosling M., Tirén J. Deep level transient spectroscopy of fast ion tracks in silicon. J. Appl. Phys. 67:1990;1266-1271.
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 1266-1271
-
-
Hallén, A.1
Sundquist, B.U.R.2
Paska, Z.3
Svensson, B.G.4
Rosling, M.5
Tirén, J.6
-
12
-
-
0017631109
-
Defect states in electron-bombarded silicon: Capacitance transient analyses
-
Kimerling L.C. Defect states in electron-bombarded silicon: capacitance transient analyses. Inst. Phys. Conf. Ser. 31:1977;221-230.
-
(1977)
Inst. Phys. Conf. Ser.
, vol.31
, pp. 221-230
-
-
Kimerling, L.C.1
-
13
-
-
0020169807
-
Defect production and lifetime control in electron and γ irradiated silicon
-
Brotherton S.D., Bradley P. Defect production and lifetime control in electron and γ irradiated silicon. J. Appl. Phys. 53:1982;5720-5732.
-
(1982)
J. Appl. Phys.
, vol.53
, pp. 5720-5732
-
-
Brotherton, S.D.1
Bradley, P.2
-
14
-
-
0015374797
-
Electrical properties of N-type Si layers doped with protons bombardment induced shallow donors
-
Ohmura Y., Zohta Y., Kanazawa M. Electrical properties of N-type Si layers doped with protons bombardment induced shallow donors. Solid State Commun. 11:1972;263-266.
-
(1972)
Solid State Commun.
, vol.11
, pp. 263-266
-
-
Ohmura, Y.1
Zohta, Y.2
Kanazawa, M.3
-
15
-
-
0000310978
-
Evolution of shallow donors with proton fluence in n-type silicon
-
Ntsoenzok E., Desgardin P., Saillard M., Vernois J., Barbot J.F. Evolution of shallow donors with proton fluence in n-type silicon. J. Appl. Phys. 79:1996;8274-8277.
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 8274-8277
-
-
Ntsoenzok, E.1
Desgardin, P.2
Saillard, M.3
Vernois, J.4
Barbot, J.F.5
-
16
-
-
0035333809
-
Local lifetime control by light ion irradiation: Impact on blocking capability of power P-i-N diode
-
Hazdra P., Brand K., Rubeš J., Vobecký J. Local lifetime control by light ion irradiation: impact on blocking capability of power P-i-N diode. Microelectron. J. 32:2001;449-456.
-
(2001)
Microelectron. J.
, vol.32
, pp. 449-456
-
-
Hazdra, P.1
Brand, K.2
Rubeš, J.3
Vobecký, J.4
-
17
-
-
0013459472
-
Defect distribution near the surface of electron-irradiated silicon
-
Wang K.L., Lee Y.H., Corbett J.W. Defect distribution near the surface of electron-irradiated silicon. Appl. Phys. Lett. 33:1978;547-548.
-
(1978)
Appl. Phys. Lett.
, vol.33
, pp. 547-548
-
-
Wang, K.L.1
Lee, Y.H.2
Corbett, J.W.3
-
18
-
-
0037371685
-
Radiation defect distribution in silicon irradiated with 600 keV electrons
-
Hazdra P., Dorschner H. Radiation defect distribution in silicon irradiated with 600 keV electrons. Nucl. Instrum. Meth. B. 201:2003;513-519.
-
(2003)
Nucl. Instrum. Meth. B
, vol.201
, pp. 513-519
-
-
Hazdra, P.1
Dorschner, H.2
-
19
-
-
0036135437
-
Defect distributions in silicon implanted with low doses of MeV ions
-
Hallén A., Keskitalo N. Defect distributions in silicon implanted with low doses of MeV ions. Nucl. Instrum. Meth. B. 186:2002;344-348.
-
(2002)
Nucl. Instrum. Meth. B
, vol.186
, pp. 344-348
-
-
Hallén, A.1
Keskitalo, N.2
-
20
-
-
0742326836
-
Impact of lifetime control on the reverse recovery of high-power P-i-N diode
-
Vobecký J., Hazdra P., Galster N. Impact of lifetime control on the reverse recovery of high-power P-i-N diode. Proc. ISPS'2000. 2000;85-92.
-
(2000)
Proc. ISPS'2000
, pp. 85-92
-
-
Vobecký, J.1
Hazdra, P.2
Galster, N.3
-
21
-
-
0036136214
-
Optimum lifetime structuring in silicon power diodes by means of various irradiation techniques
-
Hazdra P., Vobecký J., Brand K. Optimum lifetime structuring in silicon power diodes by means of various irradiation techniques. Nucl. Instrum. Meth. B. 186:2002;414-418.
-
(2002)
Nucl. Instrum. Meth. B
, vol.186
, pp. 414-418
-
-
Hazdra, P.1
Vobecký, J.2
Brand, K.3
|