Characterizing the molecular order of phosphonic acid self-assembled monolayers on indium tin oxide surfaces

Langmuir

Volumn 27, Issue 19, 2011, Pages 11883-11888

  Losego, Mark D ^a   Guske, Joshua T ^b   Efremenko, Alina ^b   Maria, Jon Paul ^a   Franzen, Stefan ^b  

^a North Carolina State University   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN DIMENSION; GRAIN SIZE; GRAIN STRUCTURES; INDIUM TIN OXIDE; MOLECULAR ORDERS; MORPHOLOGICAL FEATURES; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; NEAR-IR; OPTICS APPLICATION; PHOSPHONIC ACIDS; SAMS; SILICON SUBSTRATES; SMOOTH SURFACE; SPUTTER PRESSURE; SYSTEMATIC CHANGES; SYSTEMATIC ENGINEERING; TILT ANGLE;

CARBON FILMS; CHAIN LENGTH; GRAIN SIZE AND SHAPE; INDIUM; INDIUM COMPOUNDS; ORGANIC ACIDS; OXIDE FILMS; SELF ASSEMBLED MONOLAYERS; SILICON COMPOUNDS; SILICON OXIDES; SURFACE MORPHOLOGY; TIN; TIN OXIDES;

SURFACE ROUGHNESS;

INDIUM TIN OXIDE; PHOSPHONIC ACID DERIVATIVE; TIN DERIVATIVE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMICAL STRUCTURE; CHEMISTRY; PARTICLE SIZE; SURFACE PROPERTY; SYNTHESIS;

MEMBRANES, ARTIFICIAL; MOLECULAR STRUCTURE; PARTICLE SIZE; PHOSPHONIC ACIDS; SURFACE PROPERTIES; TIN COMPOUNDS;

EID: 80053305868     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la201161q     Document Type: Article

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