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Volumn 315, Issue 1-2, 1998, Pages 40-43

FTIR reflection absorption spectroscopy for organic thin film on ITO substrate

Author keywords

Deposition process; Dielectric properties; Fourier transform infrared spectroscopy (FTIR); FTIR reflection absorption spectroscopy (FTIR RAS); ITO substrate; Organic thin film; Polyvinylcarbazole; Reflection spec; Thickness monitor

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT REFLECTION; PERMITTIVITY; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING TIN COMPOUNDS; SUBSTRATES; THIN FILMS; VINYL RESINS;

EID: 0032473257     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00466-5     Document Type: Article
Times cited : (13)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.