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Volumn 315, Issue 1-2, 1998, Pages 40-43
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FTIR reflection absorption spectroscopy for organic thin film on ITO substrate
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Author keywords
Deposition process; Dielectric properties; Fourier transform infrared spectroscopy (FTIR); FTIR reflection absorption spectroscopy (FTIR RAS); ITO substrate; Organic thin film; Polyvinylcarbazole; Reflection spec; Thickness monitor
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Indexed keywords
ABSORPTION SPECTROSCOPY;
CHEMICAL VAPOR DEPOSITION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
LIGHT REFLECTION;
PERMITTIVITY;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTING TIN COMPOUNDS;
SUBSTRATES;
THIN FILMS;
VINYL RESINS;
INDIUM TIN OXIDE (ITO) SUBSTRATE;
POLYVINYLCARBAZOLE;
SEMICONDUCTING FILMS;
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EID: 0032473257
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(97)00466-5 Document Type: Article |
Times cited : (13)
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References (15)
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