High spatial resolution studies of surfaces and small particles using electron beam techniques

Journal of Electron Spectroscopy and Related Phenomena

Volumn 143, Issue 2-3 SPEC. ISS., 2005, Pages 205-218

  Venables, J A ^a,b   Liu, J ^c  

^a ARIZONA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF SUSSEX   (United Kingdom)

^c MONSANTO COMPANY   (United States)

Author keywords

Auger electrons; Backscattered electrons; Secondary electrons; Small particle catalysts; Surfaces; UHV electron microscopy

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; CATALYSTS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON MICROSCOPES; FLUORESCENCE; IMAGING TECHNIQUES; IONIZATION; MONTE CARLO METHODS; OPTICAL RESOLVING POWER; SCANNING ELECTRON MICROSCOPY; SIGNAL TO NOISE RATIO; X RAYS;

AUGER ELECTRONS; BACKSCATTERD ELECTRONS; SECONDARY ELECTRONS; SMALL PARTICLE CATALYSTS;

SURFACE CHEMISTRY;

EID: 14544283279     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.05.008     Document Type: Article

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99. A. Howie J. Microsc. 180 1995 192 For an overview, see; F.J. Pijper, and P. Kruit Phys. Rev. B 44 1991 9192 for details, see; M.R. Scheinfein, J. Drucker, and J.K. Weiss J. Microsc. 47 1993 4068; J. Drucker, and M.R. Scheinfein J. Microsc. 47 1993 15973; J. Drucker J. Appl. Phys. 74 1993 7329; P. Kruit Surf. Sci. 287 1993 1067
100. A. Howie J. Microsc. 180 1995 192 For an overview, see; F.J. Pijper, and P. Kruit Phys. Rev. B 44 1991 9192 for details, see; M.R. Scheinfein, J. Drucker, and J.K. Weiss J. Microsc. 47 1993 4068; J. Drucker, and M.R. Scheinfein J. Microsc. 47 1993 15973; J. Drucker J. Appl. Phys. 74 1993 7329; P. Kruit Surf. Sci. 287 1993 1067
101. A. Howie J. Microsc. 180 1995 192 For an overview, see; F.J. Pijper, and P. Kruit Phys. Rev. B 44 1991 9192 for details, see; M.R. Scheinfein, J. Drucker, and J.K. Weiss J. Microsc. 47 1993 4068; J. Drucker, and M.R. Scheinfein J. Microsc. 47 1993 15973; J. Drucker J. Appl. Phys. 74 1993 7329; P. Kruit Surf. Sci. 287 1993 1067
102. A. Howie J. Microsc. 180 1995 192 For an overview, see; F.J. Pijper, and P. Kruit Phys. Rev. B 44 1991 9192 for details, see; M.R. Scheinfein, J. Drucker, and J.K. Weiss J. Microsc. 47 1993 4068; J. Drucker, and M.R. Scheinfein J. Microsc. 47 1993 15973; J. Drucker J. Appl. Phys. 74 1993 7329; P. Kruit Surf. Sci. 287 1993 1067
103. A. Howie J. Microsc. 180 1995 192 For an overview, see; F.J. Pijper, and P. Kruit Phys. Rev. B 44 1991 9192 for details, see; M.R. Scheinfein, J. Drucker, and J.K. Weiss J. Microsc. 47 1993 4068; J. Drucker, and M.R. Scheinfein J. Microsc. 47 1993 15973; J. Drucker J. Appl. Phys. 74 1993 7329; P. Kruit Surf. Sci. 287 1993 1067
104. A. Howie J. Microsc. 180 1995 192 For an overview, see; F.J. Pijper, and P. Kruit Phys. Rev. B 44 1991 9192 for details, see; M.R. Scheinfein, J. Drucker, and J.K. Weiss J. Microsc. 47 1993 4068; J. Drucker, and M.R. Scheinfein J. Microsc. 47 1993 15973; J. Drucker J. Appl. Phys. 74 1993 7329; P. Kruit Surf. Sci. 287 1993 1067
105. We are indebted to P. Rez for this important insight. But of course there are practical reasons for impatience, including radiation damage and specimen drift!
106. J.A. Venables, and J. Liu A.P. Hubbard The Encyclopedia of Surface and Colloid Science 2002 Marcel Dekker