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Volumn 110, Issue 5, 2011, Pages

Characterization of the electrical contact between a conductive atomic force microscope cantilever and a carbon nanotube

(3) Ghanem, Tarek K a Williams, Ellen D a Fuhrer, Michael S a

a University of Maryland (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; BIAS CONDITIONS; CONDUCTIVE ATOMIC FORCE MICROSCOPES; CURRENT FLUCTUATIONS; ELECTRICAL CONTACTS; GEOMETRIC PARAMETER; GOLD-COATED; LOADING FORCE; MOVABLE ELECTRODES; PLANAR MOTION; TELEGRAPH NOISE;

CARBON NANOTUBES; ELECTRIC CONTACTS; GOLD COATINGS; LOADING; NANOCANTILEVERS; TELEGRAPH;

ATOMIC FORCE MICROSCOPY;

EID: 80052919704 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3626811 Document Type: Conference Paper

Times cited : (8)

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