Theoretical analysis on electronic properties of zigzag-type single-walled carbon nanotubes under radial deformation

Computational Materials Science

Volumn 30, Issue 3-4 SPEC. ISS., 2004, Pages 283-287

  Umeno, Yoshitaka ^a   Kitamura, Takayuki ^a   Kushima, Akihiro ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Band gap energy; Carbon nanotube; Deformation; Electronic property; Radial compression; Tight binding

Indexed keywords

COMPUTER SIMULATION; CONSTRAINT THEORY; CRYSTAL ATOMIC STRUCTURE; DEFORMATION; ELASTICITY; ELECTRONIC PROPERTIES; VECTORS;

BAND GAP ENERGY; RADIAL COMPRESSION; SEMICONDUCTING PROPERTIES; TIGHT-BINDING;

CARBON NANOTUBES;

EID: 3142683103     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.commatsci.2004.02.018     Document Type: Conference Paper

References (16)

1. Iijima S. Nature. 354:1991;56-58.
2. Iijima S., Ichihashi T. Nature. 363:1993;603-604.
3. Hamada N., Sawada S., Oshiyama A. Phys. Rev. Lett. 68:1992;1579-1581.
4. Tanaka K., Okahara K., Okada M., Yamabe T. Chem. Phys. Lett. 191:1992;469-472.
5. Saito R., Fujita M., Dresselhaus G., Dresselhaus M.S. Appl. Phys. Lett. 60:1992;2204-2206.
6. Yang L., Anantram M.P., Han J., Lu J.P. Phys. Rev. B. 60:1999;13874-13878.
7. Yang L., Han J. Phys. Rev. Lett. 85:2000;154-157.
8. Ito T., Nishidate K., Baba M., Hasegawa M. Surf. Sci. 514:2002;222-226.
9. Kiliç Ç., Ciraci S., Gülseren O., Yildirim T. Phys. Rev. B. 62:2000;16345-16348.
10. Ogata S., Shibutani Y. Phys. Rev. B. 68:2003;165409.
11. Y. Umeno, T. Kitamura, A. Kushima, Comp. Mater. Sci., in press.
12. Mehl M.J., Papaconstantopoulos D.A. Phys. Rev. B. 54:1996;4519-4530.
13. Ohno K., Esfarjani K., Kawazoe Y. Computational Materials Science: From Ab Initio to Monte Carlo Methods. vol. 77:1999;Springer, New York.
14. Rapaport D.C. The Art of Molecular Dynamics Simulation. 1995;Cambridge University Press, Cambridge.
15. Haile J.M. Molecular Dynamics Simulation. 1997;Wiley, New York.
16. Lu J.Q., Wu J., Duan W., Liu F., Zhu B.F., Gu B.L. Phys. Rev. Lett. 90:2003;156601.