Modeling and probing hot-carrier luminescence from MOSFETs

IEEE Electron Device Letters

Volumn 29, Issue 4, 2008, Pages 350-352

  Tosi, Albert ^a   Dalla Mora, Alberto ^a   Pozzi, Fiorella ^a   Zappa, Franco ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

Electroluminescence; Hot carriers; Integrated circuit testing; Luminescence; Modeling; MOSFETs

Indexed keywords

ELECTROLUMINESCENCE; HOT CARRIERS; INTEGRATED CIRCUIT TESTING; LIGHT EMISSION; LUMINESCENCE OF SOLIDS; TIMING JITTER;

CROSS-CHECK MEASUREMENTS; LUMINESCENCE WAVEFORMS; PHOTON EMISSION;

MOSFET DEVICES;

EID: 41749099462     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2008.918265     Document Type: Article

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