TRE signal processing by positive photon discrimination

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2004, Pages 263-266

  Desplats, Romain ^a   Faggion, Gaël ^a   Remmach, Mustapha ^a   Beaudoin, Felix ^a   Perdu, Philippe ^a   Lewis, D ^b  

^a CNES   (France)

^b UNIVERSITÉ BORDEAUX 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRIC POTENTIAL; INTEGRATED CIRCUITS; JITTER; KINETIC ENERGY; MOS DEVICES; PHOTONS; PROBABILITY; SEMICONDUCTING SILICON;

GAUSSIAN CORRECTIONS; HARMONIC FREQUENCIES; POSITIVE PHOTON DISCRIMINATION; TIME RESOLVED PHOTON EMISSION (TRE);

SIGNAL PROCESSING;

EID: 14844299365     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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