Time resolved photon emission processing flow for IC analysis

Microelectronics Reliability

Volumn 44, Issue 9-11 SPEC. ISS., 2004, Pages 1655-1662

  Desplats, R ^a   Faggion, G ^a   Remmach, M ^a   Beaudoin, F ^a   Perdu, P ^a   Lewis, D ^b  

^a CNES   (France)

^b UNIVERSITÉ BORDEAUX 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; ELECTRIC POTENTIAL; PHOTONS; QUANTUM EFFICIENCY; SEMICONDUCTING SILICON; SUBSTRATES; SWITCHING CIRCUITS; TRANSISTORS;

CUTOFF FREQUENCY; INTEGRATED CIRCUIT (IC) ANALYSIS; INTRABAND ABSORPTION; TIME RESOLVED PHOTON EMISSION (TRE);

INTEGRATED CIRCUITS;

EID: 4544240307     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.07.086     Document Type: Conference Paper

References (8)

1. J.A. Kash, J.C. Tsang, "Dynamic internal testing of CMOS circuits using hot luminescence", IEEE Electron Device Letter. 18 (1997) 330.
2. G. Dajee, et al., "Practical, Non-invasive Optical Probing for Flip-Chip Devices", ITC (2001) 433.
3. R. Desplats et Al, "Automated PICA Transistor Channeling and Spatial-Temporal Photon Correlation for Faster IC Diagnosis", IRPS 2003.
4. R. Desplats et Al., "Positive Photon Discrimination for Ultra Low Voltage IC Analysis", IRPS2004.
5. R. Desplats et al, "Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling", ESREF 2003.
6. R. Desplats et Al., "Fault Localization using Time Resolved Photon Emission and STIL Waveforms", ITC2003.
7. R. Desplats, G. Rolland, "Method for locating faulty elements in an integrated circuit", US Patent 6,526,546, Sep 15, 1999[FR].
8. D.Martin et Al., "Automated Diagnosis and Probing Flow for Fast Fault Localization in IC", ESREF2004.