Observations of cluster ions originating from non-traditional atom probe materials

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 1236-1237

  Prosa, T J ^a   Alvis, R A ^a   Kelly, T F ^a  

^a Imago Scientific Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549103991     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608083736     Document Type: Conference Paper

References (4)

1. T.T. Tsong, Atom-Probe Field Ion Microscopy, Cambridge University Press, New York, 1990.
2. B.P. Gorman et al., Microsc. Microanal. 13 (2007) 493.
3. T.J. Prosa et al., Microsc. Microanal. 13 (Suppl. 2) (2007) 190.
4. J.H. Bunton et al., Microsc. Microanal. 13 (2007) 418.