Two-dimensional grating-based X-ray phase-contrast imaging using Fourier transform phase retrieval

Optics Express

Volumn 19, Issue 4, 2011, Pages 3339-3346

  Itoh, Hidenosuke ^a   Nagai, Kentaro ^a   Sato, Genta ^a   Yamaguchi, Kimiaki ^a   Nakamura, Takashi ^a   Kondoh, Takeshi ^a   Ouchi, Chidane ^a   Teshima, Takayuki ^a   Setomoto, Yutaka ^a   Den, Toru ^a  

^a CANON INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; FOURIER ANALYSIS; PHASE MODULATION; QUANTUM OPTICS; TWO DIMENSIONAL; X RAYS;

AMPLITUDE GRATINGS; DIFFERENTIAL PHASE; HIGH ASPECT RATIO; PHASE GRATING; PHASE RETRIEVAL; SINGLE EXPOSURE; SINGLE SHOTS; SOFT TISSUE; SYNCHROTRON RADIATION SOURCE; TWO-DIMENSIONAL GRATING; X-RAY PHASE-CONTRAST IMAGING;

FOURIER TRANSFORMS;

EID: 79951588109     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.003339     Document Type: Article

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