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Volumn 158, Issue 8, 2011, Pages

Microstructure evolution of sputtered Bi-Te films during post-annealing: Phase transformation and its effects on the thermoelectric properties

Author keywords

[No Author keywords available]

Indexed keywords

AS-DEPOSITED FILMS; ELEVATED TEMPERATURE; HETEROGENEOUS PHASE; MATERIALS PROCESS; METASTABLE PHASE; MICROSTRUCTURE EVOLUTIONS; NUCLEATION AND GROWTH; PHASE TRANSFORMATION; POST ANNEALING; ROCK-SALT STRUCTURE; STABLE PHASE; THERMOELECTRIC PROPERTIES;

EID: 80051712876     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3598174     Document Type: Article
Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.