Raman spectroscopy of Bi-Te thin films

Journal of Raman Spectroscopy

Volumn 39, Issue 2, 2008, Pages 205-210

  Russo, V ^a   Bailini, A ^a   Zamboni, M ^a   Passoni, M ^a   Conti, C ^b   Casari, C S ^a   Li Bassi, A ^a   Bottani, C E ^a  

^a POLITECNICO DI MILANO   (Italy)

^b CNR   (Italy)

Author keywords

Bi2Te3; Bi4Te3; BiTe; Group theory; Thin films

Indexed keywords

BISMUTH COMPOUNDS; ENERGY DISPERSIVE SPECTROSCOPY; GROUP THEORY; NANOCRYSTALS; PULSED LASER DEPOSITION; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; TELLURIUM COMPOUNDS; X RAY DIFFRACTION;

BISMUTH TELLURIDE THIN FILMS; CONTROLLED STRUCTURES; GROWTH ORIENTATIONS; MICROCRYSTALLINES; NANOCRYSTALLINES; POLYCRYSTALLINE THIN FILM; RAMAN CHARACTERIZATION; RAMAN INVESTIGATIONS; THERMOELECTRIC PROPERTIES; THIN-FILMS;

THIN FILMS;

EID: 51549093127     PISSN: 03770486     EISSN: 10974555     Source Type: Journal    
DOI: 10.1002/jrs.1874     Document Type: Conference Paper

References (25)

1. Nolas GS, Sharp J, Goldsmid HJ. Thermoelectrics. Springer: New York, 2001; 117.
2. Dresselhaus MS, Chen G, Tang MY, Yang R, Lee H, Wang D, Ren Z, Fleurial JP, Gogna P. Adv. Mater. 2007; 19: 1043.
3. Heremans J, Thrush CM. Phys. Rev. B 1999; 59(19): 12579.
4. Touzelbaev MN, Zhou P, Venkatasubramanian R, Goodson KE. J. Appl. Phys. 2001; 90: 763.
5. Dauscher A, Thomy A, Scherrer H. Thin Solid Films 1996; 280: 61.
6. Makala RS, Jagannadham K, Sales BC. J. Appl. Phys. 2003; 94: 3907.
7. Pavelka M, Zeipl R, Jelínek M, Walachová J, Studniška V, Jurek K. Surf. Coat. Technol. 2005; 200: 273.
8. Zeipl R, Pavelka M, Jelínek M, Chval J, Lošták P, Ždánský K, Vaniš J, Karamazov S, Vacková S, Walachová J. Phys. Status Solidi (c) 2003; 3: 867.
9. Yamasaki I, Yamanaka R, Mikami M, Sonobe H, Mori Y, Sasaki T. Proc. 17th International Conference on Thermoelectrics, Nagoya, 1998; 210.
10. Lange PW. Naturwissenschaften 1939; 27: 133.
11. Francombe MH. Br. J. Appl. Phys. 1958; 9: 415.
12. Hansen M, Anderko K, Constitution of Binary Alloys, Vol.339. McGraw-Hill: New York, 1958; 1177.
13. Stasova MM. Zh. Strukt. Khim. [transl. J. Struct. Chem. 1967; 8: 584] 1967; 8: 655.
14. Yamana K, Kihara K, Matsumoto T. Acta Crystallogr., Sect. B 1979; 35: 147.
15. Kim Y, Cho S, Di Venere A, Wong GKL, Ketterson JB. Phys. Rev. B 2001; 63: 155306.
16. Jenkins JO, Rayne JA, Ure RW. Phys. Rev. B 1972; 5: 3171.
17. Richter W, Kohler H, Becker CR. Phys. Status Solidi B 1977; 84: 619.
18. Kullmann W, Geurts J, Richter W, Lehner N, Rauh H, Steigenberger U, Eichhorn G, Geick R. Phys. Status Solidi. B 1984; 125: 131.
19. Pagés O, Feutelais Y, Didry JR, Keller G, Jacquemin H, Legendre B. Mater. Res. Bull. 1999; 34(7): 1065.
20. Craps M, Gothard N, Rao R, He J, Hudson J, Tritt TM, Rao AM. Mater. Res. Soc. Symp. Proc. 2006; 886: F03.
21. Bos JW, Zandbergen HW, Lee MH, Ong NP, Cava RJ. Phys. Rev. B 2007; 75: 195203.
22. Chrisey DB, Hubler GK (eds). Pulsed Laser Deposition of Thin Films. Wiley: New York, 1994.
23. Rousseau DL, Bauman RP, Porto SPS. J. Raman Spectrosc. 1981; 10: 253.
24. Haro-Poniatowski M, Jouanne EM, Morhange JF, Kanehisa M. Phys. Rev. B 1999; 60: 10080.
25. Pine AS, Dresselhaus G. Phys. Rev. B 1971; 4: 356.