Molecular dynamics study of the adhesion of Cu/SiO2 interfaces using a variable-charge interatomic potential

Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 11, 2011, Pages

  Shan, Tzu Ray ^a   Devine, Bryce D ^a   Phillpot, Simon R ^a   Sinnott, Susan B ^a  

^a University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961073207     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.115327     Document Type: Article

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