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Volumn 175, Issue 3, 2011, Pages 348-352

A clarification of the terms used in comparing semi-automated particle selection algorithms in Cryo-EM

Author keywords

Cryo EM; False positive rate; Machine learning; Particle selection

Indexed keywords

ALGORITHM; ARTICLE; AUTOMATION; CONFORMATION; CRYOELECTRON MICROSCOPY; INFORMATION RETRIEVAL; MACHINE LEARNING; METRIC SYSTEM; NOMENCLATURE; PRIORITY JOURNAL;

EID: 79960928380     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2011.03.009     Document Type: Article
Times cited : (24)

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