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Volumn 145, Issue 1-2, 2004, Pages 168-180

Detecting circular and rectangular particles based on geometric feature detection in electron micrographs

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ANISOTROPY; ATOMIC PARTICLE; AUTOMATION; CONFERENCE PAPER; ELECTRON MICROSCOPY; GEOMETRY; IMAGING; MACROMOLECULE; PRIORITY JOURNAL;

EID: 0347355581     PISSN: 10478477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jsb.2003.10.027     Document Type: Conference Paper
Times cited : (46)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.