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Volumn 164, Issue 1, 2008, Pages 41-48

Particle-verification for single-particle, reference-based reconstruction using multivariate data analysis and classification

Author keywords

Automation; Electron microscopy; Particle selection; Reference bias

Indexed keywords

ALGORITHM; ARTICLE; CRYOELECTRON MICROSCOPY; ELECTRON MICROSCOPY; IMAGE DISPLAY; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RECONSTRUCTION; MULTIVARIATE ANALYSIS; PARTICLE SIZE; PRIORITY JOURNAL; RIBOSOME;

EID: 51549085335     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2008.06.006     Document Type: Article
Times cited : (37)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.