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Volumn 145, Issue 1-2, 2004, Pages 100-110

SLEUTH - A fast computer program for automatically detecting particles in electron microscope images

Author keywords

Electron microscopy; Image processing; Particle detection; Pattern recognition; Single particle reconstruction

Indexed keywords

ATOMIC PARTICLE; AUTOMATION; COMPUTER PROGRAM; CONFERENCE PAPER; DENSITY; ELECTRON MICROSCOPY; IMAGING; MATHEMATICAL COMPUTING; MOLECULAR RECOGNITION; PRIORITY JOURNAL;

EID: 0347355578     PISSN: 10478477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jsb.2003.09.011     Document Type: Conference Paper
Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.