An approach to automated particle picking from electron micrographs based on reduced representation templates

Journal of Structural Biology

Volumn 145, Issue 1-2, 2004, Pages 152-156

  Volkmann, Niels ^a  

^a BURNHAM INSTITUTE   (United States)

Author keywords

Automatic particle picking; Electron microscopy; Image processing; Pattern recognition; Single particle reconstruction; Template matching

Indexed keywords

ALGORITHM; ATOMIC PARTICLE; AUTOMATION; CONFERENCE PAPER; CORRELATION ANALYSIS; DATA ANALYSIS; ELECTRON MICROSCOPY; IMAGING; MOLECULAR MODEL; MOLECULAR RECOGNITION; PRIORITY JOURNAL; SCREENING;

EID: 0348077420     PISSN: 10478477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jsb.2003.11.026     Document Type: Conference Paper

References (5)

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2. Nicholson W.V., Glaeser R.M. Review: automatic particle detection in electron microscopy. J. Struct. Biol. 133:2001;90-101.
3. Roseman A. Particle finding in electron micrographs using a fast local correlation algorithm. Ultramicroscopy. 94:2003;225-236.
4. Volkmann N. A novel three-dimensional variant of the watershed transform for segmentation of electron density maps. J. Struct. Biol. 138:2002;123-129.
5. Zhu Y., Carragher B., Glaeser R.M., Fellmann D., Bajaj C., Bern M., Mouche F., de Haas F., Hall R.J., Kriegman D.J., Ludtke S.C., Mallick S.P., Penczek P.A., Roseman A.J., Sigworth F.J., Volkmann N., Potter C.S. Automatic particle selection: results of a comparative study. J. Struct. Biol. 145:2004;3-14.