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Volumn 129, Issue 3, 2011, Pages 678-682

Rapid ultraviolet-curing of epoxy siloxane films

Author keywords

Epoxy siloxane; Imprint lithography; Nanoidentation; UV curable polymer

Indexed keywords

DIELECTRIC STRENGTHS; EPOXY SILOXANE; FUNCTIONAL DEVICES; IMPRINT LITHOGRAPHY; NANO-IDENTATION; NANO-IMPRINTING; RAPID FABRICATION; REDUCED MODULUS; ULTRAVIOLET CURABLE; ULTRAVIOLET-CURING; UV CURABLE POLYMER; UV DOSAGE;

EID: 79960476458     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2011.05.007     Document Type: Article
Times cited : (7)

References (19)
  • 18
    • 79960483423 scopus 로고    scopus 로고
    • The positron annihilation lifetime spectroscopy (PALS) analysis for Polyset epoxy siloxne films by H. Peng and D. Gidley indicates that the film contains a few sub-nanometer voids associated with chain packing inefficiency, chain ends, and thermal fluctuations of polymer chains, which is the typical result in glassy polymers.
    • Analysis for Polyset epoxy siloxne films


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.