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Volumn 39, Issue 1 SPEC. ISSUE, 2011, Pages 85-96

Soft error benchmarking of L2 caches with PARMA

Author keywords

Cache; Reliability; Soft error

Indexed keywords

BIT ERROR RATE; CACHE MEMORY; FAILURE ANALYSIS; RADIATION HARDENING; STATIC RANDOM ACCESS STORAGE;

EID: 79960167965     PISSN: 01635999     EISSN: None     Source Type: Journal    
DOI: 10.1145/2007116.2007127     Document Type: Conference Paper
Times cited : (22)

References (30)
  • 2
    • 69549118775 scopus 로고    scopus 로고
    • SRAM interleaving distance selection with a soft error failure model
    • Aug.
    • S. Baeg, S. Wen, R. Wong, SRAM Interleaving Distance Selection With a Soft Error Failure Model, Nuclear Science, IEEE Transactions on, vol.56, no.4, pp.2111-2118, Aug. 2009.
    • (2009) Nuclear Science, IEEE Transactions on , vol.56 , Issue.4 , pp. 2111-2118
    • Baeg, S.1    Wen, S.2    Wong, R.3
  • 12
    • 36048965581 scopus 로고    scopus 로고
    • Architecture-level soft error analysis: Examining the limits of common assumptions
    • DOI 10.1109/DSN.2007.15, 4272978, Proceedings - 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2007
    • X. Li, S. Adve, P. Bose, and J.A. Rivers. Architecture-Level Soft Error Analysis: Examining the Limits of Common Assumptions. In Proceedings of the International Conference on Dependable Systems and Networks, 266-275, 2007. (Pubitemid 350080432)
    • (2007) Proceedings of the International Conference on Dependable Systems and Networks , pp. 266-275
    • Li, X.1    Adve, S.V.2    Bose, P.3    Rivers, J.A.4
  • 20
    • 29244437935 scopus 로고    scopus 로고
    • An accurate analysis of the effects of soft errors in the instruction and date caches of a pipelined microprocessor
    • M. Rebaudengo, M. S. Reorda, and M. Violante. An Accurate Analysis of the Effects of Soft Errors in the Instruction and Date Caches of a Pipelined Microprocessor. In Proceedings of the Design, Automation and Test in Europe, 602-607, 2003.
    • (2003) Proceedings of the Design, Automation and Test in Europe , pp. 602-607
    • Rebaudengo, M.1    Reorda, M.S.2    Violante, M.3
  • 21
    • 0025419560 scopus 로고
    • Reliability of scrubbing recovery techniques for memory systems
    • A.M.Saleh, J.J.Serrano, and J.H.Patel. Reliability of Scrubbing Recovery Techniques for Memory Systems. In IEEE Transactions on Reliability, 39(1), 114-122, 1990.
    • (1990) IEEE Transactions on Reliability , vol.39 , Issue.1 , pp. 114-122
    • Saleh, A.M.1    Serrano, J.J.2    Patel, J.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.