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Applied Physics Letters

Volumn 98, Issue 19, 2011, Pages

Resistive switching behaviors of NiO films with controlled number of conducting filaments

(7) Kim, Y S a Kim, J S a Choi, J S a Hwang, I R a Hong, S H a Kang, S O a Park, B H a

a Konkuk University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITOR STRUCTURES; CONDUCTING FILAMENT; CONDUCTIVE ATOMIC FORCE MICROSCOPES; DC SPUTTERING; NIO FILMS; PT ELECTRODE; RESISTIVE SWITCHING BEHAVIORS; SWITCHING VOLTAGES;

ATOMIC FORCE MICROSCOPY; PLATINUM; SILICON COMPOUNDS; SWITCHING SYSTEMS;

CONDUCTIVE FILMS;

EID: 79959654724 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3589825 Document Type: Article

Times cited : (25)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.