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Volumn 248, Issue 7, 2011, Pages 1651-1657

Misfit stresses and relaxation mechanisms in a nanowire containing a coaxial cylindrical inclusion of finite height

Author keywords

Cracks; Dislocations; Inclusions; Nanowires; Stress relaxation

Indexed keywords


EID: 79959596707     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.201046452     Document Type: Article
Times cited : (31)

References (36)
  • 32
    • 0002302054 scopus 로고
    • in: edited by H. Herman Interscience, New York
    • T. Mura, in: Advances in Materials Research Vol. 3, edited by H. Herman (Interscience, New York, 1968), p. 1.
    • (1968) Advances in Materials Research , vol.3 , pp. 1
    • Mura, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.