Probing the strain effect on near band edge emission of a curved ZnO nanowire via spatially resolved cathodoluminescence

Nanotechnology

Volumn 21, Issue 21, 2010, Pages

  Xue, Haizhou ^a   Pan, Nan ^a   Li, Ming ^a   Wu, Yukun ^a   Wang, Xiaoping ^a   Hou, J G ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BLUE SHIFT; COMPRESSIVE STRAIN; GEOMETRICAL MODELS; INDUCED STRAIN; INNER REGION; LINEAR RELATION; LOCAL CURVATURE; NEAR BAND EDGE EMISSIONS; OPTOELECTRONIC NANODEVICES; PEAK ENERGY; POTENTIAL APPLICATIONS; RED SHIFT; SI SUBSTRATES; SPATIALLY RESOLVED; STEP-BY-STEP; STRAIN EFFECT; ZNO NANOWIRES;

CATHODOLUMINESCENCE; ELECTRON BEAMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOWIRES; SCANNING ELECTRON MICROSCOPY; ZINC OXIDE;

TENSILE STRAIN;

EID: 77951806416     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/21/215701     Document Type: Article

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