Experimental study on electron field emission, Raman scattering, and low temperature electrical properties of nanocrystalline lead selenide thin films

Journal of Applied Physics

Volumn 109, Issue 10, 2011, Pages

  Mukherjee, Nillohit ^a,c   Ahmed, Sk F ^b   Maji, Swarup Kumar ^c   Mondal, Anup ^c  

^a Korea Research Institute of Chemical Technology   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

^c INDIAN INSTITUTE OF ENGINEERING SCIENCE AND TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON FIELD EMISSION; ELECTRON FIELD EMISSION PROPERTIES; EXPERIMENTAL STUDIES; FIELD EMITTER; FUNCTION VALUES; HIGH RESOLUTION X RAY DIFFRACTION; LEAD SELENIDE; LOW TEMPERATURES; NANOCRYSTALLINES; RAMAN ANALYSIS; ROOM TEMPERATURE; STRUCTURAL CHARACTERIZATION; THRESHOLD FIELDS;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; ELECTRON EMISSION; FIELD EMISSION; HIGH RESOLUTION ELECTRON MICROSCOPY; RAMAN SCATTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 79958806497     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3585864     Document Type: Conference Paper

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