Comparative study on the properties of galvanically deposited nano- and microcrystalline thin films of PbSe

Journal of Electronic Materials

Volumn 39, Issue 8, 2010, Pages 1177-1185

  Mukherjee, Nillohit ^a   Mondal, Anup ^a  

^a INDIAN INSTITUTE OF ENGINEERING SCIENCE AND TECHNOLOGY   (India)

Author keywords

Electrochemical synthesis; Nanostructure; Semiconducting lead compounds; Structural and electrical characterizations; Thin films

Indexed keywords

ALTERNATING CURRENT; AQUEOUS SOLUTIONS; BLUE SHIFT; COATED GLASS SUBSTRATES; COMPARATIVE STUDIES; DIRECT-CURRENT; ELECTRICAL CHARACTERIZATION; ELECTRICAL MEASUREMENT; ELECTROCHEMICAL SYNTHESIS; ETHYLENEDIAMINETETRAACETIC ACID; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; FILM DEPOSITION; FILM RESISTIVITY; INFRARED SPECTRAL ANALYSIS; JUNCTION PROPERTIES; MICROCRYSTALLINE THIN FILMS; NANOCRYSTALLINE FILMS; NANOCRYSTALLINES; PH SENSITIVE; ROOM TEMPERATURE; SACRIFICIAL ANODES; STRUCTURAL AND ELECTRICAL CHARACTERIZATIONS; TRANSPARENT CONDUCTING OXIDE; X-RAY DIFFRACTION STUDIES;

COMPLEXATION; CONDUCTIVE FILMS; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; GLASS; IMAGE ANALYSIS; LEAD; NANOSTRUCTURES; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING LEAD COMPOUNDS; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY MICROSCOPES;

SEMICONDUCTING FILMS;

EID: 77954624397     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-010-1194-4     Document Type: Article

References (28)

1. S. Gorer, A. Albu-Yaron, and G. Hodes, J. Phys. Chem. 99, 16442 (1995).
2. J. Zhu, H. Wang, S. Xu, and H. Chen, Langmuir 18, 3306 (2002).
3. M.A. Green, Physica E 14, 65 (2002).
4. D. Yun, W. Feng, H. Wu, and K. Yoshino, Solar Energy Mater. Solar Cell 8, 1208 (2009).
5. A.J. Nozik, Chem. Phys. Lett. 1-3, 3 (2008).
6. P.S. Nair, K.P. Friz, and G. Scholes, Chem. Commun. 24, 2084 (2004).
7. H. Du, C. Chen, R. Krishan, T.D. Krauss, J.M. Harbold, F.W. Wise, M.G. Thomas, and J. Silcox, Nano Lett. 2, 1321 (2002).
8. J.M. Pietryga, R.D. Schaller, D. Weder, M.H. Stewart, V.I. Kilmov, and J.A. Hollingsworth, J. Am. Chem. Soc. 126, 11752 (2204).
9. P. Pramanik, S. Biswas, P.K. Basu, and A. Mondal, J. Mater. Sci. Lett. 9, 1120 (1990).
10. R. Dalven, Infrared Phys. 9, 141 (1969).
11. R.A. Zingaro and D.O. Skovlin, J. Electrochem. Soc. 111, 42 (1964).
12. V.D. Das and K.S. Bhat, J. Mater. Sci. 1, 169 (1990).
13. R.T. Rumianowski, R.S. Dygdala, W. Jung, and W. Bala, J. Cryst. Growth 252, 230 (2003).
14. A.N. Molin and A.I. Dikusar, Thin Solid Films 265, 3 (1995).
15. J. Yang, J. Heo, T. Zhu, J. Xu, J. Topolancik, F. Vollmer, R. Ilic, and P. Bhattacharya, Appl. Phys. Lett. 92, 261110 (2008).
16. X. Jiang, R.D. Schaller, S.B. Lee, J.M. Pietryga, V.I. Klimov, and A.A. Zakhidov, J. Mater. Res. 22, 2204 (2007).
17. T. Zhu, A. Berger, Z.A. Tan, D.H. Cui, J. Xu, P. Khanchaitit, and Q. Wang, J. Appl. Phys. 104, 044306 (2008).
18. K.W. Li, X.T. Meng, X. Liang, H. Wang, and H. Yan, J. Solid State Electrochem. 10, 48 (2006).
19. A. Mondal, N. Mukherjee, and S.K. Bhar, Mater Lett 60, 1748 (2006).
20. K.R. Murali, I. Radhakrishna, K.N. Rao, and V.K. Venkatesan, J. Mater. Sci. 25, 3521 (1990).
21. A. Mondal, B.E. McCandless, and R.W. Birkmire, Solar Energy Mater. Solar Cell 26, 181 (1992).
22. B.E. McCandless, A. Mondal, and R.W. Birkmire, Solar Energy Mater. Solar Cell 36, 369 (1995).
23. N. Mukherjee, P. Bhattacharyya, M. Banerjee, A. Mondal, T. Robert, T. Gettens, P.K. Ghosh, and H. Saha, Nanotechnology 17, 2665 (2006).
24. A. Mondal and N. Mukherjee, Mater. Lett. 60, 2672 (2006).
25. A. Mondal, N. Mukherjee, S.K. Bhar, and D. Banerjee, Thin Solid Films 515, 1255 (2006).
26. N. Mukherjee, Sk.F. Ahmed, D. Mukherjee, K.K. Chattopadhyay, and A. Mondal, Physica Status Solidi C 5, 3458 (2008).
27. R.B. Kale and C.D. Lokhande, Appl. Surf. Sci. 223, 343 (2004).
28. J. Zhu, S.T. Aruna, Y. Koltypin, and A. Gedanken, Chem. Mater. 12, 143 (2000).