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Volumn 119, Issue 1-2, 1997, Pages 50-54

Study of CdS nanocrystallites by AFM and Raman scattering spectroscopy

Author keywords

Atomic force microscopy; Cadmium sulfide; Raman spectroscopy; Surface defects

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SURFACE ROUGHNESS;

CADMIUM SULFIDE; SURFACE DEFECTS;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0031235767 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(97)00177-3 Document Type: Article

Times cited : (28)

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