Errors, artifacts, and improvements in EBSD processing and mapping

Microscopy and Microanalysis

Volumn 11, Issue 1, 2005, Pages 79-87

  Tao, Xiaodong ^a   Eades, Alwyn ^a  

^a Lehigh University   (United States)

Author keywords

Artifacts; Binning; EBSD; Electron back scatter diffraction; Gaussian filter; Hough transform; Image quality; IQ

Indexed keywords

EID: 14744280667     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927605050099     Document Type: Article

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