Random thoughts on non-random misorientation distributions

Materials Science and Technology

Volumn 22, Issue 11, 2006, Pages 1287-1296

  Wright, S I ^a  

^a EDAX TSL   (United States)

Author keywords

EBSD; Misorientation texture; Misorientations; OIM

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; POLYCRYSTALLINE MATERIALS;

ELECTRON BACKSCATTER DIFFRACTION (EBSD); MISORIENTATION TEXTURE; ORIENTATION IMAGING MICROSCOPY (OIM);

CRYSTAL ORIENTATION;

EID: 33751378401     PISSN: 02670836     EISSN: None     Source Type: Journal    
DOI: 10.1179/174328406X130876     Document Type: Article

References (28)

1. B. L. Adams: Metall. Trans. A, 1986, 17A, 2199-2207.
2. S. I. Wright: 'Individual lattice orientation measurements development and applications of a fully automatic technique', PhD thesis, Yale University, New Haven, CT, USA, 1992.
3. E. M. Lehockey, A. M. Brennenstuhl and I. Thompson: Corros. Sci., 2004, 46, 2383-2404.
4. T. R. McNelley, D. L. Swisher and M. T. Pérez-Prado: Metall. Mater. Trans. A, 2002, 33, 279-290.
5. J. A. Nucci, R. R. Keller, D. P. Field and Y. Shacham-Diamand: Appl. Phys. Lett., 1997, 70, 1242-1244.
6. S. V. Boxel, M. Seefeldt, B. Verlinden and P. V. Houtte: J. Microsc., 2005, 218, 104-114.
7. S. Godet, Y. He and J. J. Jonas: Acta Mater., 2005, 53, 1179-1190.
8. T. Nakamura, S. Ochiai, S. Iwamoto, D. Adaehi and H. Okuda: J. Iron Steel Inst. Jpn, 2005, 91, 342-348.
9. D. Li and C. J. Boehlert: Metall. Mater. Trans. A, 2005, 36A, 2569-2584.
10. F. C. Frank: Metall. Trans. A, 1987, 19A, 403-408.
11. D. J. Prior: J. Microsc., 1999, 195, 217-225.
12. A. J. Wilkinson: Scr. Mater., 2001, 44, 2379-2385.
13. D. M. Saylor, B. S. El-Dasher, B. L. Adams and G. S. Rohrer: Metall. Mater. Trans. A, 2004, 35, 1981-1989.
14. Y. Pan, B. L. Adams, T. Olson and N. Panayotou: Acta Mater., 1996, 44, 4685-4694.
15. J. Zhao, J. S. Koontz and B. L. Adams: Metall. Trans. A, 1988, 19, 1179-1185.
16. S. I. Wright and R. J. Larsen: J. Microsc., 2002, 205, 245-252.
17. V. Randle: Scr. Mater., 2001, 44, 2789-2794.
18. S. I. Wright and M. M. Nowell: Chin. J. Stereol. Image Anal., 2005, 10, 193-198.
19. S. I. Wright, D. P. Field and M. M. Nowell: Mater. Sci. Forum, 2005, 495-497, 1121-1130.
20. J. Zhao, B. L. Adams and P. R. Morris: Text. Microstruct., 1988, 8-9, 493-508.
21. J. Pospiech, K. Lücke and K. Sztwiertnia: Acta Metall. Mater., 1993, 41, 305-321.
22. J. K. Mackenzie: Biometrika, 1958, 45, 229-240.
23. J. K. Mackenzie and M. J. Thomson: Biometrika, 1957, 44, 205-210.
24. A. Morawiec: 'Orientations and rotations: computations in crystal-lography textures'; 2004, Berlin, Springer.
25. D. P. Field: Ultramicroscopy, 1997, 67, 1-9.
26. S. C. Hogg, I. G. Palmer and P. S. Grant: Proc. 9th Int. Conf. on 'Aluminium alloys', (ed. J. F. Nie et al.), Vol. 28, 325-331; 2005, Brisbane, Institute of Materials Engineering Australasia.
27. M. M. Nowell and S. I. Wright: Ultramicroscopy, 2005, 103, 41-58.
28. M. M. Nowell and S. I. Wright: J. Microsc., 2004, 213, 296-305.