Orientation effects on indexing of electron backscatter diffraction patterns

Ultramicroscopy

Volumn 103, Issue 1, 2005, Pages 41-58

  Nowell, Matthew M ^a   Wright, Stuart I ^a  

^a EDAX TSL   (United States)

Author keywords

Confidence index; EBSD; Electron backscatter diffraction; Indexing; Orientation

Indexed keywords

ALGORITHMS; BACKSCATTERING; MICROSTRUCTURE; OPTIMIZATION; POLYCRYSTALLINE MATERIALS;

AUTOMATED INDEXING ALGORITHMS; ELECTRON BACKSCATTER DIFFRACTION (EBSD); POLYCRYSTALLINE MICROSTRUCTURES;

ELECTRON DIFFRACTION;

ALGORITHM; AUTOMATION; CONFERENCE PAPER; CRYSTALLOGRAPHY; DIFFRACTION; ELECTRON TRANSPORT; METHODOLOGY;

EID: 14944364732     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.11.012     Document Type: Conference Paper

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