Optical characterization of TiO2-Ge nanocomposite films obtained by reactive magnetron sputtering

Digest Journal of Nanomaterials and Biostructures

Volumn 6, Issue 3, 2011, Pages 915-920

  Slav, A ^a  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

FT Ir; Magnetron sputtering; Optical band gap; XRD

Indexed keywords

EID: 79958159749     PISSN: None     EISSN: 18423582     Source Type: Journal    
DOI: None     Document Type: Article

References (35)

1. U. Diebold, Surf. Sci. Rep. 48, 53 (2003).
2. O. Carp, C. L. Huisman, and A. Reller, Prog. Solid State Chem. 32, 33 (2004).
3. M. Fernández-García, A. Martínez-Arias, J. C. Hanson, and J. A. Rodriguez, Chem. Rev. (Washington, D.C.) 104, 4063 (2004).
4. G. Wilk, R. Wallace, and J. Anthony, J. Appl. Phys. 89, 5243 (2001).
5. B. O'Regan and M. Grätzel, Nature (London) 353, 737 (1991)
6. A. Fujishima and K. Honda, Nature (London) 238, 37 (1972).
7. A. L. Linsebigler, G. Lu, and J. T. Yates, Jr., Chem. Rev. (Washington, D.C.) 95, 735 (1995).
8. N. Umezawa, A. Janotti, P. Rinke, T. Chikyow, and C. G. Van de Walle, Appl. Phys. Lett. 92, 041104 (2008).
9. E. Yagi, R. R. Hasiguti, and M. Aono, Phys. Rev. B 54, 7945 (1996).
10. J. Yahia, Phys. Rev. 130, 1711 (1963).
11. C. J. Kevane, Phys. Rev. 133, A1431 (1964).
12. L. Forro, O. Chauvet, D. Emin, L. Zuppiroli, H. Berger, and F. Levy, J. Appl. Phys 75, 633 (1994).
13. J. Nowotny, M. Radecka, M. Rekas, S. Sugihara, E. R. Vance, and W. Weppner, Ceram. Int. 24, 571 (1998).
14. M. K. Nowotny, T. Bak, and J. Nowotny, J. Phys. Chem. B 110, 16270 (2006).
15. P. Kofstad, J. Less-Common Met. 13, 635 (1967).
16. D Reyes-Coronado, G Rodriguez-Gattorno, M E Espinosa-Pesqueira, C Cab, R de Coss and G Oskam, Nanotechnology 19, 145605 (2008) (10pp)
17. Young Ran Park, Kwang Joo Kim, Thin Solid Films 484, 34 (2005)
18. S. Sankar and K. G. Gopchandran, Cryst. Res. Technol. 44(9), 989 (2009)
19. P. Madhu Kumar, S. Badrinarayanan, Murali Sastry, Thin Solid Films 358, 122 (2000).
20. S. Chatterjee, Nanotechnology 19, 265701 (2008) (9pp)
21. S. Chatterjee, Solar energy 82, 95-99 (2008)
22. Cheol Ho Heo, Soon-Bo Lee, Jin-Hyo Boo, Thin Solid Films 475, 183 (2005)
23. P. Baroch, J. Musil, J. Vlcek, K.H. Nam, J.G. Han, Surface & Coatings Technology 193, 107 (2005).
24. P. Barquinha, L. Pereira, H. Águas, E. Fortunato, R. Martins, Materials Science in Semiconductor Processing 7, 243 (2004)
25. S. Chatterjee, J. Phys. D: Appl. Phys. 41, 055301 (2008) (9pp)
26. G. Socrates, "Infrared and Raman characteristics group frequencies", Wiley (2001)
27. S. Tripathi, R. Brajpuriya, A. Sharma, A. Soni, G.S. Okram, S.M. Chaudhari, T. Shripathi, J. Nanosci. Nanotechnol. 8(6), 2955 (2008)
28. E.B. Gorokhov, V.A. Volodin, D.V. Marin, D.A. Orekhov, A.G. Cherkov, A.K. Gutakovskii, V.A. Shvets, A.G. Borisov, M.D. Efremov, Semiconductors 39, 1168 (2005)
29. A. Welte, C. Waldauf, C. Brabec, P.J. Wellmann, Thin Solid Films 516, 7256 (2008)
30. A.F. Khan, M. Mehmood, A.M. Rana, T. Muhammad, Appl. Surf. Sci. (2009)
31. P.A. Calderon, M.C. Irisson, C.-W. Chen, Nanoscale Res. Lett. 3, 55 (2008)
32. J. Tauc, et al., 627 Phys. Stat. Sol. 15, 627 (1966)
33. S. Kowalczyk et al, Sol. St. Comm. 23,161 (1977)
34. D.C. Cronemeyer, Phys. Rev. 87, 876 (1952)
35. A. Faheem Khan, M. Mehmood, M. Aslam, S.I. Shah, Journal of Colloid and Interface Science 343, 271 (2010).