Nanocrystalline TiO2 studied by optical, FTIR and X-ray photoelectron spectroscopy: Correlation to presence of surface states

Thin Solid Films

Volumn 358, Issue 1, 2000, Pages 122-130

  Kumar, Madhu ^a   Badrinarayanan, S ^a   Sastry, Murali ^a  

^a NATIONAL CHEMICAL LABORATORY   (India)

Author keywords

Nanostructures; Surface and interface states; Surface composition; Titanium oxide

Indexed keywords

CORRELATION METHODS; EMISSION SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; NANOSTRUCTURED MATERIALS; PARTICLES (PARTICULATE MATTER); PHOTOEMISSION; PHOTOLUMINESCENCE; SURFACE STRUCTURE; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

NANOPARTICLES;

TITANIUM DIOXIDE;

EID: 0033898336     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00722-1     Document Type: Article

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