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Volumn 475, Issue 1-2 SPEC. ISS., 2005, Pages 183-188
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Deposition of TiO2 thin films using RF magnetron sputtering method and study of their surface characteristics
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Author keywords
Deposition parameter effects; Phase transition; RF magnetron sputtering; TiO2 thin film
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Indexed keywords
ANNEALING;
CHEMICAL VAPOR DEPOSITION;
CRYSTAL GROWTH;
CRYSTAL STRUCTURE;
EVAPORATION;
GLASS;
MAGNETRON SPUTTERING;
NATURAL FREQUENCIES;
PHASE TRANSITIONS;
POLYCRYSTALLINE MATERIALS;
REFRACTIVE INDEX;
SURFACE TREATMENT;
THERMAL EFFECTS;
THIN FILMS;
DEPOSITION PARAMETER EFFECTS;
GLASS SUBSTRATES;
RF MAGNETRON SPUTTERING;
TIO2 THIN FILMS;
TITANIUM DIOXIDE;
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EID: 13444263510
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2004.08.033 Document Type: Conference Paper |
Times cited : (172)
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References (10)
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