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Volumn 475, Issue 1-2 SPEC. ISS., 2005, Pages 183-188

Deposition of TiO2 thin films using RF magnetron sputtering method and study of their surface characteristics

Author keywords

Deposition parameter effects; Phase transition; RF magnetron sputtering; TiO2 thin film

Indexed keywords

ANNEALING; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; CRYSTAL STRUCTURE; EVAPORATION; GLASS; MAGNETRON SPUTTERING; NATURAL FREQUENCIES; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; REFRACTIVE INDEX; SURFACE TREATMENT; THERMAL EFFECTS; THIN FILMS;

EID: 13444263510     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.08.033     Document Type: Conference Paper
Times cited : (172)

References (10)
  • 3
    • 0003717218 scopus 로고
    • 10th edition McGraw-Hill New York
    • G.S. Brady Materials Handbook 10th edition 1971 McGraw-Hill New York 815
    • (1971) Materials Handbook , pp. 815
    • Brady, G.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.