Chemical degradation mechanisms of organic photovoltaics studied by TOF-SIMS and isotopic labeling

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5938, Issue , 2005, Pages 1-12

  Norrman, Kion ^a   Krebs, Frederik C ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Degradation mechanism; Lifetimes; Organic photovoltaics; Oxygen isotopic labeling; Polymer photovoltaics; Time of flight secondary ion mass spectrometry; TOF SIMS

Indexed keywords

DEGRADATION; MASS SPECTROMETRY; ORGANIC POLYMERS; OXIDATION; OXYGEN;

ORGANIC PHOTOVOLTAICS; OXYGEN ISOTOPIC LABELING; POLYMER PHOTOVOLTAICS;

PHOTOVOLTAIC CELLS;

EID: 31744446565     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.613433     Document Type: Conference Paper

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