SCOPUS 정보 검색 플랫폼

Volumn 90, Issue 2, 2006, Pages 213-227

Lifetimes of organic photovoltaics: Using TOF-SIMS and 18O 2 isotopic labelling to characterise chemical degradation mechanisms

(2) Norrman, Kion a Krebs, Frederik C a

a TECHNICAL UNIVERSITY OF DENMARK (Denmark)

Author keywords

Degradation mechanism; Lifetimes; Organic photovoltaics; Oxygen isotopic labelling; Polymer photovoltaics; Secondary ion mass spectrometry; TOF SIMS

Indexed keywords

ALUMINUM; DEGRADATION; DIFFUSION; ELECTRODES; MOLECULAR DYNAMICS; ORGANIC POLYMERS; OXYGEN; SECONDARY ION MASS SPECTROMETRY;

DEGRADATION MECHANISMS; LIFETIMES; ORGANIC PHOTOVOLTAICS; OXYGEN ISOTOPIC LABELING; POLYMER PHOTOVOLTAICS; TOF-SIMS;

PHOTOVOLTAIC CELLS;

EID: 27844472680 PISSN: 09270248 EISSN: None Source Type: Journal
DOI: 10.1016/j.solmat.2005.03.004 Document Type: Article

Times cited : (167)

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